顯微測量系統(tǒng)

Vic-3D Micro™ Microscopy

 

Correlated Solutions, Inc.出品的Vic-3D Micro™系統(tǒng)是Vic-3D系列測量解決方案產(chǎn)品線的新成員。 Vic-3D Micro可在高放大倍數(shù)下實現(xiàn)精確的位移和應(yīng)變測量。

The Vic-3D Micro™ system by Correlated Solutions, Inc. is a new addition to the Vic-3D product line of measurement solutions. Vic-3D Micro enables accurate displacement and strain measurements under high magnification.
 
 
 

技術(shù)背景 Background

 

由于三維數(shù)字圖像相關(guān)技術(shù)（DIC）具有出色的準(zhǔn)確性、穩(wěn)健性和易用性，因此已廣泛應(yīng)用于應(yīng)變測量。但是，對于需要高放大倍數(shù)的樣品，3D測量仍很難獲得。這主要是由于缺乏具有足夠景深的光學(xué)元件以從不同視角獲取3D分析所需的兩張高放大率圖像。

Three-dimensional digital image correlation (DIC) has found widespread popularity for strain measurements due to its excellent accuracy, robustness and ease of use. However, 3D measurements have been difficult to obtain on specimens where high magnification is required. This is mainly due to the lack of optics with sufficient depth-of-field to acquire two high magnification images from different viewing angles.

microscope

立體顯微鏡克服了這些景深限制。然而，立體顯微鏡的內(nèi)部結(jié)構(gòu)妨礙了使用傳統(tǒng)模型（例如Seidel鏡頭失真）對圖像失真進行適當(dāng)校正。這些未經(jīng)校正的圖像將導(dǎo)致形貌和應(yīng)變測量產(chǎn)生嚴(yán)重的偏差。事實上，觀察中數(shù)千微應(yīng)變的偏差量級并不鮮見。

Stereo microscopes overcome these depth-of-field limitations. However, the internal construction of stereo microscopes prevents proper correction of image distortions using traditional models, such as Seidel lens distortions. These uncorrected images will result in severely biased shape and strain measurements. In fact, it is not uncommon to observe bias levels of several thousａnd microstrain.

為了克服這個問題，CSI公司開發(fā)了一種易于使用的標(biāo)定方法，該方法不會遇到與傳統(tǒng)參數(shù)失真模型相關(guān)的問題。 該標(biāo)定方法計算立體顯微鏡的非參數(shù)畸變場，并已被證實可*消除測量中的形貌和應(yīng)變偏差。

To overcome this problem, Correlated Solutions, Inc., has developed an easy-to-use calibration method that does not suffer from the problems associated with traditional parametric distortion models. The calibration method computes the non-parametric distortion fields of the stereo microscope and has been shown to completely eliminate shape and strain bias from the measurements.

 

 

系統(tǒng)特性 System Features

 
  • 視場范圍（變焦范圍）：0.8mm-7mm
  • 三維坐標(biāo)，位移，速度和完整應(yīng)變張量的全場測量
  • 自動標(biāo)定
  • 圖像匹配可以通過簡單的調(diào)整自動重疊
  • 強大的數(shù)據(jù)可視化工具
    • 數(shù)據(jù)云圖顯示可以覆蓋在測試樣本的圖像上
    • 根據(jù)用戶定義的線條和圓圈從3D圖中提取數(shù)據(jù)
    • 用于統(tǒng)計分析、應(yīng)力 - 應(yīng)變曲線等數(shù)據(jù)的后處理工具
  • 使用FLEXPortTM數(shù)據(jù)工具方便地輸出數(shù)據(jù)
    • 數(shù)據(jù)可以以Tecplot /純ASCII，Matlab和STL格式輸出
    • 節(jié)點數(shù)據(jù)可以輕松提取用于FEA驗證
  • 一年的技術(shù)支持和軟件升級
    • 7*24小時提供實時技術(shù)支持
    • 同時提供現(xiàn)場支持和咨詢
  • 所有部件材料和/或制造缺陷的一年更換保修
  • Field of view (zoom range): 0.8mm-7mm
  • Full-field measurements of 3D coordinates, displacements, velocities, and complete strain tensors
  • Automatic calibration
  • Image pairs can be automatically overlapped with a simple adjustment
  • Powerful tools for visualizing data
    • Contour displays which can be overlaid onto images of the test specimen
    • Data extraction from 3D plots based on user defined lines and circles
    • Post-processing tools for statistical analysis, stress-strain curves, and more
  • Convenient exporting of data with the FLEXPortTM data tool
    • Data can be exported in Tecplot/plain ASCII, Matlab, and STL formats
    • Node data can be easily extracted for FEA validation
  • One year of technical support and software upgrades
    • Live technical support is available 7*24 H
    • On-site support and consulting is also available
  • One-year replacement warranty for defects in materials and/or workmanship on all parts.