E6607C EXT無線通信測試儀
E6607C EXT無線通信測試儀
E6607C EXT Multiport Wireless Communications Test Set
安捷倫科技公司日前宣布推出新型 E6607C EXT 無線通信測試儀。該測試儀內(nèi)置多端口適配器，可同時測試多個無線設(shè)備，以實現(xiàn)經(jīng)濟高效的大規(guī)模無線設(shè)備生產(chǎn)測試。與 EXT-B 相比，EXT-C的測試速度提升了3倍，但價格卻降低了 1.3倍。
隨著智能手機和平板電腦的產(chǎn)量越來越高，相應(yīng)的測試方案也需要進行調(diào)整，以便適應(yīng)當前包含多種功能無線裝置、制式和頻段的復(fù)雜無線設(shè)備。Agilent E6607C EXT-C 可提高測試速率，維持總體測試設(shè)備的成本效益，同時又能減少生產(chǎn)線的空間和電能需求，因而是應(yīng)對上述測試挑戰(zhàn)的理想選擇。
Agilent E6607C EXT-C 是一款整合式單機綜合測試儀，其配置包括矢量信號分析儀、矢量信號發(fā)生器、高速序列分析儀和 8個用于無線蜂窩制式的雙向輸入/輸出端口以及4個用于GNSS測試的輸出端口。
針對無線調(diào)制解調(diào)器芯片組中實施的快速序列非信令測試模式，*的 EXT-C 序列分析儀可以與調(diào)制解調(diào)器芯片組同步工作，消除信令開銷，實現(xiàn)單次采集多次測量。EXT-C 可對經(jīng)過*校準的多個被測器件執(zhí)行測試，從而幫助制造商更快速地進行測試，并提高生產(chǎn)線的產(chǎn)量。
為了盡量減少測試流程的變化，并簡化從研發(fā)到批量生產(chǎn)的過渡，EXT-C 利用安捷倫信號分析儀的各項豐富的 X 系列測量技術(shù)，為客戶提供了專為快速生產(chǎn)制造測試而設(shè)計的測量應(yīng)用軟件。EXT-C 能夠匹配多種 X 系列測量應(yīng)用軟件，用于蜂窩通信、無線連通性和數(shù)字音頻/視頻等應(yīng)用。它支持 LTE FDD、LTE TDD、TD-SCDMA 和 2G/3G 等標準。單獨 X 系列測量應(yīng)用軟件可在最初購買儀器時購買，也可在購買儀器后添加。
EXT-C 的全套軟件工具功能互補，可以加快測試開發(fā)。例如，Agilent Signal Studio 可輕松創(chuàng)建非信令控制和測試信號，以便與 EXT 配合使用。在試生產(chǎn)階段，Agilent Sequence Studio 支持工程師快速創(chuàng)建測試計劃并進行故障診斷。為了地縮短生產(chǎn)代碼測試開發(fā)的時間，安捷倫芯片組軟件針對特定的無線芯片組調(diào)制解調(diào)器提供了自動化校準和驗證功能。
E6607C 在功能方面*向后兼容上一代 E6607B EXT 和 E6617A MPA 組合。為了適應(yīng)未來生產(chǎn)測試的需求，EXT-C 提供高達 3.8 GHz 的全蜂窩頻段范圍（包括 LTE TDD 43 頻段），并支持芯片組要求的快速序列測試模式。
描述
Transforming manufacturing test
Improve your ROI while getting your next generation cellular devices to market faster
The Agilent Technologies E6607C (EXT-C) wireless communications test set has the capability you need to achieve high throughput test of your complex cellular devices with an effective investment of capital. In today’s competitive environment you cannot afford to pay for idle test equipment resources. With its integrated multiport capability the EXT-C makes optimum use of the integrated VSA/VSG with parallel receiver and fast switched transmitter testing.
The EXT-C is a one-box, non-signaling test set that integrates an innovative test sequencer, vector signal analyzer (VSA), vector signal generator (VSG) and a precision multiport adapter. The EXT-C includes eight bi-directional input/output ports for multi-format cellular testing, and four output ports for GNSS testing. Fast, standards-compliant measurements and modulation analysis capabilities are based on the proven measurement algorithms of the Agilent X-Series signal analyzers.
With the fast and accurate measurements, and flexible sequencer techniques of the E6607B (EXT-B), the EXT-C works to lower your cost of test with a lower cost integrated multi-port solution that provides additional benefits of reduced foot print and reduced power consumption.
主要特性與技術(shù)指標
Integrated Multiport Enables Efficient Multi-DUT Test
Integrated multiport provides for parallel receiver test / fast switched transmitter test making effective use of test equipment resources
Lower cost, smaller footprint, lower power consumption verses use of external multiport adapter
Fully compatible with software written for E6607A / E6607B for seamless integration in manufacturing
Add external display, mouse, and keyboard, for full manual control and functionality equivalent to E6607B & MPA
Anticipate your wireless device manufacturing test needs
Benefit from an architecture that is optimized for lower-cost next generation non-signaling test
Add multi-format standards-based calibration and verification test support as needed for LTE TDD/FDD, HSPA+, W-CDMA, 1xEV-DO, cdma2000®, GSM, EDGE-Evo, TD-SCDMA, WiMAXTM, Bluetooth®, GPS/GNSS, and more
Ensure your test system is future proof due to its modern, scalable architecture
Accelerate test development
Ensure seamless transition from NPI to production with proven X-Series analyzer measurements science
Simplify signal creation to synchronize, control, and test your wireless device with Signal Studio software
Streamline test plan creation and troubleshooting in a graphical interface with Sequence Studio software
Reduce time to volume manufacturing with Chipset Software to optimize device calibration and verification
Achieve fast and accurate measurements
Maximize throughput with fast-sequenced, non-signaling test modes for modern chipsets
Speed up your test plan in sequence analyzer mode with single acquisition, multiple measurements
Increase your production yield with superior measurement accuracy
Cost effective integrated Multiport Adapter with metrology grade precision and balancing
