Linear arrays
High penetration / Wide scan linear arrays
Applications
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Automated high-performance inspection of submerged parts: metal plates, bars, pipes, composite materials, forged parts, etc.
Principle & Advantages
The scanned length (L) is maximised by combining a large number
of elements (typically between 64 to 512) with the widest possible
inter-element pitch (p).
Electronic focusing can be combined with scanning, for example, to inspect at different depths. In general, electronic deflection is little used for this type of application.
- Inspection time is reduced through the high speed of the electronic scanning combined with a large scanning width.
- The scanning mechanism is simplified.
Standard Configurations:
Freq. (MHz) | Nb elts | Pitch p (mm) | Active size L x h (mm) | Housing size L x W x H (mm)* |
10 | 64 | 0.5 | 32x10 | 40x16x35 |
10 | 128 | 0.5 | 64x10 | 75x20x40 |
5 | 64 | 1 | 64x15 | 75x20x40 |
5 | 128 | 1 | 128x15 | 140x25x45 |
2.25 | 128 | 1.5 | 192x15 | 205x30x45 |
2.25 | 64 | 2 | 128x20 | 140x30x35 |
*Indicative values
General Characteristics
- Frequency from 300 kHz to 20 MHz
- Unlimited number of elements, typically from 64 to 512
- Versatile, Dynamic, Accuracy or Hard face acoustic technology
- Ergonomic or basic housing
- Good axial resolution and reduction of the unseen area beneath the surface thanks to a short pulse length
- Reproducibility of the inspection because of the homogeneity of the elements of the same probe and the different probes of the same type
- High reliability over time thanks to a design that is watertight and resistant to corrosion, compatible with permanent immersion under 1m of water
Options
- Pre-focused active area (see below)
- Captive screws of lateral flanges for wedge attachment
- Integrated wedge
- Housing adapted to the probe holder
- Low profile and side cable for wheel probe
- Halogen-free for nuclear environments
- Customized cabling
- Adaptation to a particular environment (temperature, pressure, radiation, chemical compatibility)
Mechanical Pre-focusing On linear arrays, electronic focusing is possible only in the plane of incidence. However, in the perpendicular plane (passive aperture), it is possible to adjust focal depth and lateral resolution by using mechanical pre-focusing, by choosing the appropriate radius of curvature, active width (h) and water path.
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